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Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Rodbell, Kenneth P. Marshall, Paul W. Schwank, James R. Gordon, Michael S. Castaneda, Carlos M. Berg, Melanie D. Phan, Anthony M. Seidleck, Christina M. Pellish, Jonathan A. LaBel, Kenneth A. Dodds, Nathaniel A. Kim, Hak S. |
| Copyright Year | 2014 |
| Description | We report low-energy proton and low-energy alpha particle single-event effects (SEE) data on a 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) latches and static random access memory (SRAM) that demonstrates the criticality of using low-energy protons for SEE testing of highly-scaled technologies. Low-energy protons produced a significantly higher fraction of multi-bit upsets relative to single-bit upsets when compared to similar alpha particle data. This difference highlights the importance of performing hardness assurance testing with protons that include energy distribution components below 2 megaelectron-volt. The importance of low-energy protons to system-level single-event performance is based on the technology under investigation as well as the target radiation environment. |
| File Size | 511487 |
| Page Count | 8 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20150000377 |
| Archival Resource Key | ark:/13960/t9h46qw98 |
| Language | English |
| Publisher Date | 2014-12-01 |
| Access Restriction | Open |
| Subject Keyword | Random Access Memory Proton Single-event Effects Protons Radiation Hardening Soi Semiconductors Laboratories Energy Distribution Single Event Upsets Alpha Particles Research Facilities Proton Energy Weak Energy Interactions Monte Carlo Method Cmos Ion Beams Nuclear Research Electronic Equipment Tests Degradation Linear Energy Transfer Let Particle Energy Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |