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Criticality of low-energy protons in single-event effects testing of highly-scaled technologies (Document No: 20140017830)
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Castaneda, C. M. LaBel, K. A. Marshall, P. W. Pellish, J. A. Seidleck, C. M. Phan, A. M. Dodds, N. A. Schwank, J. R. Rodbell, K. P. Berg, M. D. Kim, H. S. Gordon, M. S. |
| Copyright Year | 2014 |
| File Size | 646942 |
| Page Count | 12 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20140017830 |
| Archival Resource Key | ark:/13960/t48q1177x |
| Language | English |
| Publisher Date | 2014-07-14 |
| Access Restriction | Open |
| Subject Keyword | Ionizing Radiation Single-event Effects Proton Irradiation Extraterrestrial Radiation Radiation Belts Systematic Errors Ionization Single Event Upsets Random Access Memory Alpha Particles Bragg Curve Chips Electronics Solar Protons Cmos Data Reduction Electronic Equipment Tests Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Presentation |