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Resonant difference-frequency atomic force ultrasonic microscope
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Copyright Year | 2010 |
| Description | A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features. |
| File Size | 1024833 |
| Page Count | 13 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20110000824 |
| Archival Resource Key | ark:/13960/t9j43r86b |
| Language | English |
| Publisher Date | 2010-12-07 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Atomic Force Microscopy Patents Resonant Frequencies Surface Reactions Inventions Oscillations Ultrasonic Radiation Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Patent |
