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Nanoscale subsurface imaging via resonant difference-frequency atomic force ultrasonic microscopy
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Cantrell, John H. Cantrell, Sean A. Lilehei, Peter T. |
| Copyright Year | 2007 |
| Description | A novel scanning probe microscope methodology has been developed that employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by the fundamental resonance frequency of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever fundamental resonance. The resonance-enhanced difference-frequency signals are used to create images of embedded nanoscale features. |
| File Size | 48353 |
| Page Count | 11 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20080007508 |
| Archival Resource Key | ark:/13960/t1wd8tw6s |
| Language | English |
| Publisher Date | 2007-01-01 |
| Access Restriction | Open |
| Subject Keyword | Composite Materials Atomic Force Microscopy Nanostructure Characteristics Resonant Frequencies Imaging Techniques Surface Properties Ultrasonic Radiation Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
