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Low-energy proton testing methodology
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Friendlich, M. R. Reed, Robert A. Weller, Robert A. Schwank, James R. Ladbury, Raymond L. Sierawski, B. D. Pellish, Jonathan A. Kim, Hak S. Xapsos, M. A. Rodbell, Kenneth P. Berg, Melanie Marshall, Paul W. Shaneyfelt, Marty R. Phan, Anthony Hakey, Mark C. Mendenhall, Marcus H. Dodd, Paul E. Heidel, David F. LaBel, Kenneth A. |
| Copyright Year | 2009 |
| Description | Use of low-energy protons and high-energy light ions is becoming necessary to investigate current-generation SEU thresholds. Systematic errors can dominate measurements made with low-energy protons. Range and energy straggling contribute to systematic error. Low-energy proton testing is not a step-and-repeat process. Low-energy protons and high-energy light ions can be used to measure SEU cross section of single sensitive features; important for simulation. |
| File Size | 4015417 |
| Page Count | 17 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20090027717 |
| Archival Resource Key | ark:/13960/t76t5ng6s |
| Language | English |
| Publisher Date | 2009-04-20 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Protons Sensitivity Light Ions Simulation Single Event Upsets Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |