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Current single event effects results for candidate spacecraft electronics for nasa
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | O'Bryan, Martha V. Sanders, Anthony B. Marshall, Cheryl J. Hawkins, Donald K. Reed, Robert A. Kniffin, Scott D. Cox, Stephen R. Seidleck, Christina M. Carts, Martin A. LaBel, Kenneth A. |
| Copyright Year | 2004 |
| Description | We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others. |
| File Size | 756828 |
| Page Count | 8 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20040171177 |
| Archival Resource Key | ark:/13960/t22c3zz1h |
| Language | English |
| Publisher Date | 2004-01-01 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Protons Vulnerability Heavy Ions Spacecraft Electronic Equipment Single Event Upsets Electronic Equipment Tests Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
