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Recent single event effects results for candidate spacecraft electronics for nasa
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | O'Bryan, Martha V. Oldham, Timothy R. Ladbury, Ray L. Kniffin, Scott D. Irwin, Tim Buchner, Stephen P. Forney, James D. Kim, H. LaBel, Kenneth A. Howard Jr., James W. |
| Copyright Year | 2005 |
| Description | Vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices. |
| File Size | 19590338 |
| Page Count | 10 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_20050210237 |
| Archival Resource Key | ark:/13960/t6062hx0k |
| Language | English |
| Publisher Date | 2005-01-01 |
| Access Restriction | Open |
| Subject Keyword | Spacecraft Instrumentation And Astrionics Protons Performance Tests Spacecraft Instruments Bipolarity Electronics Ions Vulnerability Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |