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Life cycle testing of ba(x)sr(1-x)tio3 ferroelectric thin films in a tunable microwave device
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Warner, Joseph D. Miranda, Felix A. Mueller, Carl H. VanKeuls, Fred W. Romanofsky, Robert R. |
| Copyright Year | 2000 |
| Description | Thin film ferroelectrics are being studied as candidates for novel tunable microwave components such as tunable filters, tunable oscillators, and phase shifters for applications in phased array antennas. Much work has been done optimizing the ferroelectric material and in producing proof-of-concepts of these components. However, little attention has been given to their reliability. In this study we present our results on the reliability of high quality K-band phase shifters made of Ba(sub x)Sr(sub 1-x)TiO3 (BSTO) ferroelectric thin films (0.5 to 0.75 micrometers thick) on MgO and LAO. The phase shift and insertion loss were measured at 300 K over 104 operation cycles within a 0 to 400 V dc bias range (0 to 40 V/micrometer) at 15, 18, and 22 GHz. Results for these phase shifters indicate that in general there were no appreciable changes in phase shift after 4x10(exp 4) cycles, suggesting that these phase shifters are robust enough to sustain optimal performance under the operating mode typical of fast tracking phased arrays. |
| File Size | 611354 |
| File Format | |
| Language | English |
| Publisher Date | 2000-09-01 |
| Access Restriction | Open |
| Subject Keyword | Electronics And Electrical Engineering Thin Films Phased Arrays Ferroelectricity Ferroelectric Materials Phase Shift Microwave Equipment Magnesium Oxides Reliability Tuning Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Article |
