NDLI: Characterization of (ba(0.5)sr(0.5)) tio3 thin films for ku-band phase shifters

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Characterization of (ba(0.5)sr(0.5)) tio3 thin films for ku-band phase shifters

Content Provider	NASA Technical Reports Server (NTRS)
Author	Warner, Joseph D. Ramesh, Rammamoorthy Canedy, Chadwick L. Mueller, Carl H. VanKeuls, Fredrick W. Miranda, Felix A. Romanofsky, Robert R.
Copyright Year	1999
Description	The microstructural properties of (Ba(0.5)Sr(0.5)TiO3) (BSTO) thin films (300, 700, and 1400 nm thick) deposited on LaAlO3 (LAO) substrates were characterized using high-resolution x-ray diffractometry. Film crystallinity was the parameter that most directly influenced tunability, and we observed that a) the crystalline quality was highest in the thinnest film and progressively degraded with increasing film thickness; and b) strain at the film/substrate interface was completely relieved via dislocation formation. Paraelectric films such as BSTO offer an attractive means of incorporating low-cost phase shifter circuitry into beam-steerable reflectarray antennas.
File Size	519495
Page Count	16
File Format	PDF
Alternate Webpage(s)	http://archive.org/details/NASA_NTRS_Archive_20000003018
Archival Resource Key	ark:/13960/t1xd5ts35
Language	English
Publisher Date	1999-10-01
Access Restriction	Open
Subject Keyword	Nonmetallic Materials Thin Films Ferroelectricity Ferroelectric Materials Phase Shift Superhigh Frequencies Barium Titanates Crystallinity Film Thickness Microstructure Antenna Arrays Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science
Content Type	Text
Resource Type	Technical Report

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