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Ebic and hvtem studies of rtr silicon ribbon
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Strunk, H. Ast, D. Cunningham, B. |
| Copyright Year | 1981 |
| Description | The defect structure of RTR ribbon #6-731, run 803 was studied. Prior to laser recrystallization the defect structure consists of closely spaced twin and grain boundaries. Precipitation of impurities occurs after laser recrystallization. The observation of electrically active defects in EBIC was correlated with HVTEM studies. Pairs of electrically active defects in twin boundaries are due to stacking faults connecting the twin boundaries. |
| File Size | 1412476 |
| Page Count | 18 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19810018020 |
| Archival Resource Key | ark:/13960/t7cs0n80h |
| Language | English |
| Publisher Date | 1981-04-01 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Grain Boundaries Crystal Defects Heat Treatment Ribbons Electron Beams Laser Heating Impurities Precipitation Chemistry Contaminants Recrystallization Silicon Electron Microscopy Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
