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Silicon solar cell fabrication technology
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Stafsudd, O. M. |
| Copyright Year | 1980 |
| Description | Device fabrication and photoconductive lifetime decay measurements were used to characterize single and polycrystalline silicon substracts. The device characterization of the processed materials was done by spectral response measurements and absolute quantum efficiency at a single wavelength. The results were then reduced to yield the diffusion length of the various samples. The photoconductive lifetime decay method was implemented in order to determine the minority carrier lifetime in unprocessed wafers. |
| File Size | 10706797 |
| Page Count | 38 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19800023364 |
| Archival Resource Key | ark:/13960/t3hx65346 |
| Language | English |
| Publisher Date | 1980-05-15 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Solar Cells Life Durability Spectral Signatures Polycrystals Substrates Fabrication Single Crystals Photovoltaic Cells Wafers Fuel Cells Carrier Lifetime Solar Energy Plating Silicon Photoconductive Cells Manufacturing Photoconductivity Antireflection Coatings Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
