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Study of intermittent field hardware failure data in digital electronics
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Halverson, J. R. Oneill, E. J. |
| Copyright Year | 1980 |
| Description | The collection and analysis of data concerning intermittent dailures in digital devices was performed using data from a computer design for shipboard usage. The failure data consisted of actual field failures classified by failure mechanisms and their likelihood of having been intermittent, potentially intermittent, or hard. Each class was studies with respect to computer operation in the ranges of 0 to 2,000 hours, 0 to 5, hours, and 0 to 10,000 hours. The study was done at the computer level as well as the microcircuit level. Results indicate that as age increases, the quasi-intermittent failure rate increases and the mean time to failure descreases. |
| File Size | 2548356 |
| Page Count | 69 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19800021245 |
| Archival Resource Key | ark:/13960/t6256f52n |
| Language | English |
| Publisher Date | 1980-06-01 |
| Access Restriction | Open |
| Subject Keyword | Digital Systems Digital Electronics Systems Engineering Failure Analysis Failure Modes Hardware Microelectronics Reliability Intermittency Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
