Loading...
Please wait, while we are loading the content...
Similar Documents
Silicon solar cell fabrication technology (Document No: 19790023584)
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Stafsudd, O. M. |
| Copyright Year | 1979 |
| Description | The laser cell scanner was used to characterize a number of solar cells made in various materials. An electron beam-induced current (EBIC) study was performed using a stereoscan scanning electron microscope. Planar p-n junctions were analyzed. A theory for the EBIC based on the analytical solution of the ambipolar diffusion equation under the influence of electron beam excitation parameter z (which is related to beam penetration), the junction depth Z sub j, the beam current and the surface recombination, was formulated and tested. The effect of a grain boundary was studied. |
| File Size | 25550724 |
| Page Count | 36 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19790023584 |
| Archival Resource Key | ark:/13960/t6256f29p |
| Language | English |
| Publisher Date | 1979-05-02 |
| Access Restriction | Open |
| Subject Keyword | Energy Production And Conversion Solar Cells Grain Boundaries Scanning Surface Defects Semiconductor Junctions Scanners Inspection Electron Microscopes Characterization Fabrication Electron Beams Silicon Excitation Laser Applications Graphs Charts Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
