Loading...
Please wait, while we are loading the content...
Similar Documents
Tem observations on grain boundaries in sintered silicon, part 1
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Foll, H. Ast, D. G. |
| Copyright Year | 1978 |
| Description | Grain boundaries in silicon with a predetermined orientation were prepared by the sintering of two single crystals. A combination of standard transmission electron microscopy and lattice imaging was used to investigate the structure of the boundaries produced. Low angle grain boundaries on (100) and (111) planes, and twin boundaries on (111) planes are discussed in detail. |
| File Size | 6027327 |
| Page Count | 29 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19790012716 |
| Archival Resource Key | ark:/13960/t52g2hz9g |
| Language | English |
| Publisher Date | 1978-09-30 |
| Access Restriction | Open |
| Subject Keyword | Solid-state Physics Grain Boundaries Single Crystals Alignment Transmission Electron Microscopy Crystal Lattices Sintering Electron Microscopes Silicon Structural Analysis Ntrs Nasa Technical Reports Server (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |
