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Moessbauer study in thin films of fesi2 and fese systems
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Mendiratta, R. G. Aggarwal, K. Escue, W. J. |
| Copyright Year | 1978 |
| Description | Thin films of FeSi2 and FeSe were studied using Moessbauer spectroscopy information regarding dangling bond configuration and nature of crystal structure in thin films was derived. A significant influence of crystalline aluminum substrate on film structure was observed. |
| File Size | 2144761 |
| Page Count | 11 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19790002748 |
| Archival Resource Key | ark:/13960/t85j2b75h |
| Language | English |
| Publisher Date | 1978-09-01 |
| Access Restriction | Open |
| Subject Keyword | Solid-state Physics Thin Films Iron Compounds Spectrum Analysis Silicon Selenium Film Thickness Bonding Mossbauer Effect Crystal Structure Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |