Loading...
Please wait, while we are loading the content...
Similar Documents
Method of measuring the thickness of radioactive thin films
| Content Provider | NASA Technical Reports Server (NTRS) |
|---|---|
| Author | Alger, D. L. Steinberg, R. Makinen, M. D. |
| Copyright Year | 1974 |
| Description | Thickness monitor consists of proportional X-ray counter coupled to pulse counting system, copper filter over face of counter, rotatable collimator containing radioactive source, and rotatable shutter. Monitor can be used as integral part of neutron generator. It has been used to measure titanium tritide film thicknesses from 0.1 to 30 micrometers. |
| File Size | 143699 |
| Page Count | 2 |
| File Format | |
| Alternate Webpage(s) | http://archive.org/details/NASA_NTRS_Archive_19740000065 |
| Archival Resource Key | ark:/13960/t6vx54d3w |
| Language | English |
| Publisher Date | 1974-07-01 |
| Access Restriction | Open |
| Subject Keyword | Thin Films X Ray Inspection Target Thickness Neutrons Titanium Tritium Radiation Measurement Film Thickness Ntrs Nasa Technical Reports ServerĀ (ntrs) Nasa Technical Reports Server Aerodynamics Aircraft Aerospace Engineering Aerospace Aeronautic Space Science |
| Content Type | Text |
| Resource Type | Technical Report |