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Tem sample preparation of polymer based nanocomposites using focused ion beam technique.
| Content Provider | CiteSeerX |
|---|---|
| Abstract | Recently, several studies have been conducted to investigate the behavior of polymer based composites reinforced with clay particles, which can remarkably improve the properties of the polymers.1 Studies using transmission electron microscopy (TEM) are necessary to understand the role of clay minerals/particles in the reinforcing effect in the polymer based materials. TEM sample preparation of polymer/clay nanocomposites using conventional techniques has been difficult and tedious.2 Nevertheless, the focused ion beam (FIB) technique3,4 for preparing metal and ceramic samples provides another method for preparing polymer nanocomposite samples. This paper presents a new approach for preparing TEM specimens of the polymer nanocomposites using the FIB technique. Two types of epoxy (Dow Chemical Company, DER 331) nanocomposite samples were investigated: one containing 7.5 wt. % organomontmorillonite clay (Southern Clay Products Inc., Cloisite 30B) and the other (carbon fiber reinforced plastics; CFRP) containing carbon fibers (Hexel Fibers, AS4) in addition to 5 wt. % clay. Details of preparing the epoxy based clay nanocomposites will be published elsewhere. Procedures for preparing TEM thin sections using FIB were based on techniques developed by Ramirez de Arellano et al.4 A small piece was cut from each sample, and then carefully ground and polished to a thickness about 50-100?m. The polished samples were attached on a special Mo grid for FIB milling. The samples were then milled by Ga ions (accelerated at 30 kV) with different probe sizes using a Hitachi 2000A FIB system. To prevent |
| File Format | |
| Access Restriction | Open |
| Subject Keyword | Carbon Fiber Nanocomposite Sample Tem Specimen Conventional Technique New Approach Ceramic Sample Polymer Clay Dow Chemical Company Ga Ion Focused Ion Beam Clay Mineral Particle Polymer Nanocomposite Sample Different Probe Transmission Electron Microscopy Clay Nanocomposites Small Piece Fib Technique Tem Thin Section Hexel Fiber Special Mo Grid Organomontmorillonite Clay Fib Milling Tem Sample Preparation Clay Particle Fib System Several Study Polished Sample Southern Clay Product Inc |
| Content Type | Text |
| Resource Type | Article |
