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Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling
| Content Provider | Scilit |
|---|---|
| Author | Volkert, C. A. Busch, S. Heiland, B. Dehm, G. |
| Copyright Year | 2004 |
| Description | Journal: Journal of Microscopy |
| Ending Page | 212 |
| Starting Page | 208 |
| ISSN | 2573508X |
| e-ISSN | 13652818 |
| DOI | 10.1111/j.0022-2720.2004.01352.x |
| Journal | Journal of Microscopy |
| Issue Number | 3 |
| Volume Number | 214 |
| Language | English |
| Publisher | Wiley-Blackwell |
| Publisher Date | 2004-06-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Microscopy Microscopic Research Focused Ion Beam Milling Tem Sample Preparation |
| Content Type | Text |
| Resource Type | Article |