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Pulse jitter and timing errors in rsfq circuits (1999).
| Content Provider | CiteSeerX |
|---|---|
| Author | Rylyakov, Alexander V. Likharev, Konstantin K. |
| Abstract | We have carried out measurements of bit error rate (BER) of Rapid Single-Flux-Quantum (RSFQ) XOR gates with various nominal dc power supply voltages (from 0.1 V to 1.0 mV), operating at speeds up to 25 GHz. (For these gates, implemented using HYPRES' standard, 3:5-¯m; 10 ¯A=¯m 2 Nbtrilayer process, this speed is close to maximum.) A special on-chip RSFQ test circuit allowed high-speed measurements of BER in the range from 10 \Gamma9 to 10 \Gamma13 to be carried out. As a result of these experiments, a new type of thermal-fluctuation-induced digital errors in RSFQ circuits has been identified. These "timing" errors arise at high speed due to time jitter of data and clock pulses. We have developed a simple theory of these errors which allows a fair description of the experimental data. The theory shows that in some cases the timing errors may be an important factor limiting speed performance of RSFQ circuitry. Nevertheless, our XOR gates could operate at 25 GHz with BER below 10 \... |
| File Format | |
| Publisher Date | 1999-01-01 |
| Access Restriction | Open |
| Subject Keyword | Timing Error Rsfq Circuit Pulse Jitter Simple Theory Xor Gate Rsfq Circuitry Nbtrilayer Process Thermal-fluctuation-induced Digital Error High Speed New Type Time Jitter Bit Error Rate Clock Pulse Speed Performance Experimental Data High-speed Measurement Rapid Single-flux-quantum Fair Description Special On-chip Rsfq Test Circuit Important Factor |
| Content Type | Text |
