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High manufacturing-defect tolerance.
| Content Provider | CiteSeerX |
|---|---|
| Author | Watanabe, Minoru Kobayashi, Fuminori |
| Abstract | Abstract: Optically reconfigurable gate arrays, which consist simply of a holographic memory, a laser diode ar-ray, and a gate array VLSI, have a perfect parallel programmable capability. Even if a gate array VLSI includes defective areas, the perfect parallel programmable capability allows perfectly avoidance of those defective areas; instead, the remaining area on the gate array is used. Therefore, the architecture enables fabrication of large die VLSI chips and even wafer scale integrations using the latest processes with a high fraction of defects. Moreover, holographic memory is well-known to have high defect-tolerance because each bit of a reconfiguration context can be stored in the entire holographic memory and the damage of some component rarely affects its diffraction pattern or reconfiguration context. Therefore, the architecture has a high manufacturing-defect tolerance. In this paper, the high manufacturing-defect tolerance of optically programmable architectures is clarified using a single context prototype optically programmable architecture, which combines a liquid crystal spatial light modulator as a holographic memory, a He-Ne laser, and a perfectly parallel optically programmable gate-array VLSI. Key–Words:High manufacturing-defect tolerance, Field programmable gate arrays, Optical reconfiguration, Holo-graphic memory, Optically reconfigurable gate arrays 1 |
| File Format | |
| Access Restriction | Open |
| Subject Keyword | High Manufacturing-defect Tolerance Holographic Memory Gate Array Vlsi Reconfiguration Context Defective Area Programmable Architecture Perfect Parallel Programmable Capability Laser Diode Ar-ray Holo-graphic Memory Single Context Prototype Entire Holographic Memory Optical Reconfiguration Liquid Crystal Spatial Light Modulator Optically Reconfigurable Gate Array Diffraction Pattern Programmable Gate-array Vlsi Key Word Field Programmable Gate Array He-ne Laser Gate Array Scale Integration High Defect-tolerance Large Die Vlsi Chip High Fraction Reconfigurable Gate Array |
| Content Type | Text |
| Resource Type | Article |
