NDLI: High-Bandwidth Scanning of Sample Properties in Atomic Force Microscopy

Content Provider	The American Society of Mechanical Engineers (ASME) Digital Collection
Author	Mohan, Gayathri Lee, Chibum Srinivasa, M. Salapaka
Copyright Year	2012
Abstract	This paper exemplifies methods to estimate sample properties, including topographical properties, from a high bandwidth estimate of tip-sample interaction forces between the probe tip and the sample surface in an atomic force microscope. The tip-sample interaction force is the most fundamental quantity that can be detected by the probe tip. The fact that sample features as well as physical properties of the sample are a function of tip-sample interaction model chosen is exploited, and the property estimates are obtained by fitting appropriate physical models to the force estimate data. The underlying idea is to treat the non-linear tip-sample interactions as a disturbance to the cantilever subsystem and design a feedback controller that ensures the cantilever deflection tracks a desired trajectory. This tracking allows scanning speeds as high as 1/10th of the cantilever resonance frequency compared to typical scanning modes that regulate derivatives of the probe deflection such as amplitude or phase, providing much lower scan speeds. The high bandwidth disturbance rejection and consequent estimation provides estimates of the tip-sample interaction force.
Sponsorship	Dynamic Systems and Control Division
Starting Page	561
Ending Page	565
Page Count	5
File Format	PDF
ISBN	9780791845301
DOI	10.1115/DSCC2012-MOVIC2012-8757
Volume Number	Volume 2: Legged Locomotion; Mechatronic Systems; Mechatronics; Mechatronics for Aquatic Environments; MEMS Control; Model Predictive Control; Modeling and Model-Based Control of Advanced IC Engines; Modeling and Simulation; Multi-Agent and Cooperative Systems; Musculoskeletal Dynamic Systems; Nano Systems; Nonlinear Systems; Nonlinear Systems and Control; Optimal Control; Pattern Recognition and Intelligent Systems; Power and Renewable Energy Systems; Powertrain Systems
Conference Proceedings	ASME 2012 5th Annual Dynamic Systems and Control Conference joint with the JSME 2012 11th Motion and Vibration Conference
Language	English
Publisher Date	2012-10-17
Publisher Place	Fort Lauderdale, Florida, USA
Access Restriction	Subscribed
Subject Keyword	Cantilevers Design Atomic force microscopy Fittings Deflection Feedback Control equipment Trajectories (physics) Resonance Probes
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Acquisition of High Precision Images for Non-Contact Atomic Force Microscopy via Direct Identification of Sample Height

Reducing Atomic Force Microscope Tip Deflection using Command Shaping

High-speed vertical positioning for contact-mode atomic force microscopy

Force Feedback in Dynamic Atomic Force Microscopy

Correlation of Atomic Force Microscopy Tapping Forces to Mechanical Properties of Lipid Membranes

Measuring Effective Modulus With Bifurcation Based Atomic Force Microscope Method

Vision Based Force Sensing for Nanorobotic Manipulation

Combined Feedforward/Feedback Control of Atomic Force Microscopes

Tip-to-Sample Distance Control in Apertureless Near-Field Optical microscopy

High-Bandwidth Scanning of Sample Properties in Atomic Force Microscopy

Similar Documents

Acquisition of High Precision Images for Non-Contact Atomic Force Microscopy via Direct Identification of Sample Height

Reducing Atomic Force Microscope Tip Deflection using Command Shaping

High-speed vertical positioning for contact-mode atomic force microscopy

Force Feedback in Dynamic Atomic Force Microscopy

Correlation of Atomic Force Microscopy Tapping Forces to Mechanical Properties of Lipid Membranes

Measuring Effective Modulus With Bifurcation Based Atomic Force Microscope Method

Vision Based Force Sensing for Nanorobotic Manipulation

Combined Feedforward/Feedback Control of Atomic Force Microscopes

Tip-to-Sample Distance Control in Apertureless Near-Field Optical microscopy

High-Bandwidth Scanning of Sample Properties in Atomic Force Microscopy