NDLI: Design fault directed test generation for microprocessor validation

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Design fault directed test generation for microprocessor validation

Content Provider	ACM Digital Library
Author	Lilja, David Shukla, Sandeep K. Kodakara, Sreekumar V. Mathaikutty, Deepak A. Dingankar, Ajit
Abstract	Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher potential to find faults in the design. We propose a model based test generation framework that generates tests for design fault classes inspired from software validation. There are two main contributions in this paper. Firstly, we propose a microprocessor modeling and test generation framework that generates test suites to satisfy Modified Condition Decision Coverage (MCDC), a structural coverage metric that detects most of the classified design faults as well as the remaining faults not covered by MCDC. Secondly, we show that there exists good correlation between types of design faults proposed by software validation and the errors/bugs reported in case studies on microprocessor validation. We demonstrate the framework by modeling and generating tests for the microarchitecture of VESPA, a 32-bit microprocessor. In the results section, we show that the tests generated using our framework's coverage directed approach detects the fault classes with 100% coverage, when compared to model-random test generation.
Starting Page	761
Ending Page	766
Page Count	6
File Format	PDF
ISBN	9783981080124
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2007-04-16
Publisher Place	San Jose
Access Restriction	Subscribed
Content Type	Text
Resource Type	Article

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