NDLI: ConMem:detecting severe concurrency bugs through an effect-oriented approach (SIGP, Vol. 45, Issue. 3)

Content Provider	ACM Digital Library
Author	Lu, Shan Zhang, Wei Sun, Chong
Abstract	Multicore technology is making concurrent programs increasingly pervasive. Unfortunately, it is difficult to deliver reliable concurrent programs, because of the huge and non-deterministic interleaving space. In reality, without the resources to thoroughly check the interleaving space, critical concurrency bugs can slip into production runs and cause failures in the field. Approaches to making the best use of the limited resources and exposing severe concurrency bugs before software release would be desirable. Unlike previous work that focuses on bugs caused by specific interleavings (e.g., races and atomicity-violations), this paper targets concurrency bugs that result in one type of severe effects: program crashes. Our study of the error-propagation process of realworld concurrency bugs reveals a common pattern (50% in our non-deadlock concurrency bug set) that is highly correlated with program crashes. We call this pattern concurrency-memory bugs: buggy interleavings directly cause memory bugs (NULL-pointer-dereference, dangling-pointer, buffer-overflow, uninitialized-read) on shared memory objects. Guided by this study, we built ConMem to monitor program execution, analyze memory accesses and synchronizations, and predicatively detect these common and severe concurrency-memory bugs. We also built a validator ConMem-v to automatically prune false positives by enforcing potential bug-triggering interleavings. We evaluated ConMem using 7 open-source programs with 9 real-world severe concurrency bugs. ConMem detects more tested bugs (8 out of 9 bugs) than a lock-set-based race detector and an unserializable-interleaving detector that detect 4 and 5 bugs respectively, with a false positive rate about one tenth of the compared tools. ConMem-v further prunes out all the false positives. ConMem has reasonable overhead suitable for development usage.
Starting Page	179
Ending Page	192
Page Count	14
File Format	PDF
ISSN	03621340 15581160
DOI	10.1145/1735971.1736041
Journal	ACM SIGPLAN Notices (SIGP)
Volume Number	45
Issue Number	3
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	1983-05-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Software testing Concurrency bugs
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Software

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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ConMem:detecting severe concurrency bugs through an effect-oriented approach (SIGP, Vol. 45, Issue. 3)

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