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Semiconductor measurement technology : Permanent Damage Effects Of Nuclear Radiation On The X Band Performance Of Silicon Schottky Barrier Microwave Mixer Diodes
Content Provider | Internet Archive |
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Author | Kenney, James M Institute for Applied Technology (U.S.). Electronic Technology Division United States. Defense Nuclear Agency |
Language | English |
Publisher | Washington : U.S. Dept. of Commerce, National Bureau of Standards |
Publisher Date | 1976-01-01 |
Access Restriction | Open |
Subject Keyword | Microwave Measurements Effect of radiation on Mixing circuits Microwave measurements Schottky-barrier Diodes |
Content Type | Text |
Resource Type | Book |