NDLI: Simultaneous and accurate measurement of the dielectric constant at many frequencies spanning a wide range.

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Invited Review Article: Error and uncertainty in Raman thermal conductivity measurements.

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Simultaneous and accurate measurement of the dielectric constant at many frequencies spanning a wide range.

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Publisher's Note: 'Monte-Carlo simulation of noise in hard X-ray Transmission Crystal Spectrometers: Identification of contributors to the background noise and shielding optimization' [Rev. Sci. Instrum. 85, 11D615 (2014)].

Erratum: 'Physical apparatus parameters and model for vibrating tube densimeters at pressures to 140 MPa and temperatures to 473 K' [Rev. Sci. Instrum. 85, 095111 (2014)].

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Simultaneous and accurate measurement of the dielectric constant at many frequencies spanning a wide range.

Content Provider	World Health Organization (WHO)-Global Index Medicus
Author	Pérez-Aparicio, Roberto Ciliberto, Sergio Crauste-Thibierge, Caroline Metz, Pascal Cottinet, Denis Bellon, Ludovic Naert, Antoine Tanase, Marius
Description	Country affiliation: France Author Affiliation: Pérez-Aparicio R ( Laboratoire de Physique, Ecole Normale Supérieure de Lyon (ENS/CNRS, UMR 5672), 46 allée d'Italie, F69007 Lyon, France.); Crauste-Thibierge C ( Laboratoire de Physique, Ecole Normale Supérieure de Lyon (ENS/CNRS, UMR 5672), 46 allée d'Italie, F69007 Lyon, France.); Cottinet D ( Laboratoire de Physique, Ecole Normale Supérieure de Lyon (ENS/CNRS, UMR 5672), 46 allée d'Italie, F69007 Lyon, France.); Tanase M ( Laboratoire de Physique, Ecole Normale Supérieure de Lyon (ENS/CNRS, UMR 5672), 46 allée d'Italie, F69007 Lyon, France.); Metz P ( Laboratoire de Physique, Ecole Normale Supérieure de Lyon (ENS/CNRS, UMR 5672), 46 allée d'Italie, F69007 Lyon, France.); Bellon L ( Laboratoire de Physique, Ecole Normale Supérieure de Lyon (ENS/CNRS, UMR 5672), 46 allée d'Italie, F69007 Lyon, France.); Naert A ( Laboratoire de Physique, Ecole Normale Supérieure de Lyon (ENS/CNRS, UMR 5672), 46 allée d'Italie, F69007 Lyon, France.); Ciliberto S ( Laboratoire de Physique, Ecole Normale Supérieure de Lyon (ENS/CNRS, UMR 5672), 46 allée d'Italie, F69007 Lyon, France.)
Abstract	We present an innovative technique which allows the simultaneous measurement of the dielectric constant of a material at many frequencies, spanning a four orders of magnitude range chosen between 10(-2) Hz and 10(4) Hz. The sensitivity and accuracy are comparable to those obtained using standard single frequency techniques. The technique is based on three new and simple features: (a) the precise real time correction of the amplification of a current amplifier, (b) the specific shape of the excitation signal and its frequency spectrum, and (c) the precise synchronization between the generation of the excitation signal and the acquisition of the dielectric response signal. This technique is useful in the case of relatively fast dynamical measurements when the knowledge of the time evolution of the dielectric constant is needed.
ISSN	00346748
Issue Number	4
Journal	Review of Scientific Instruments
Volume Number	86
e-ISSN	10897623
Language	English
Publisher	American Institute of Physics
Publisher Date	2015-04-01
Publisher Place	United States
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Discipline Physics Discipline Chemistry
Content Type	Text
Resource Type	Article
Subject	Medicine Instrumentation

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