NDLI: High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating.

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High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating.

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High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating.

Content Provider	World Health Organization (WHO)-Global Index Medicus
Author	Silva, H. Gokirmak, A. Adnane, L. Williams, N.
Description	Country affiliation: United States Author Affiliation: Adnane L ( Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA.); Williams N ( Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA.); Silva H ( Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA.); Gokirmak A ( Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA.)
Abstract	We have developed an automated setup for simultaneous measurement of Seebeck coefficient S(T) and electrical resistivity ρ(T) of thin film samples from room temperature to â ¼650 °C. S and ρ are extracted from current-voltage (I-V) measurements obtained using a semiconductor parameter analyzer and temperature measurements obtained using commercial thermocouples. The slope and the x-axis intercept of the I-V characteristics represent the sample conductance G and the Seebeck voltage, respectively. The measured G(T) can be scaled to ρ(T) by the geometry factor obtained from the room temperature resistivity measurement of the film. The setup uses resistive or inductive heating to control the temperature and temperature gradient on the sample. Inductive heating is achieved with steel plates that surround the test area and a water cooled copper pipe coil underneath that generates an AC magnetic field. The measurements can be performed using resistive heating only or inductive heating only, or a combination of both depending on the desired heating ranges. Inductive heating provides a more uniform heating of the test area, does not require contacts to the sample holder, can be used up to the Curie temperature of the particular magnetic material, and the temperature gradients can be adjusted by the relative positions of the coil and sample. Example results obtained for low doped single-crystal silicon with inductive heating only and with resistive heating only are presented.
ISSN	00346748
Issue Number	10
Journal	Review of Scientific Instruments
Volume Number	86
e-ISSN	10897623
Language	English
Publisher	American Institute of Physics
Publisher Date	2015-10-01
Publisher Place	United States
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Discipline Physics Discipline Chemistry
Content Type	Text
Resource Type	Article
Subject	Medicine Instrumentation

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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Measurement system of the Seebeck coefficient or of the electrical resistivity at high temperature.

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High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating.

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