NDLI: Optical and structural properties of Sm-doped SrMoO$_{4}$ phosphor thin films deposited on sapphire substrates

Content Provider	Springer Nature Link
Author	Cho, Shinho
Copyright Year	2017
Abstract	SrMoO$_{4}$:Sm$^{3+}$ phosphor thin films were deposited on sapphire substrates using radio-frequency magnetron sputtering at several growth temperatures in the range of 100 - 400 °C. The effects of growth temperature on the properties of the thin films were investigated using X-ray diffraction, scanning electron microscopy, ultraviolet-visible spectrophotometry, and photoluminescence spectroscopy. The thin films exhibited a tetragonal structure with a dominant (112) diffraction peak, and relatively uniform and hexagonal-shaped particles were observed. The emission spectra under excitation at 276 nm contained four dominant emission peaks located at 567, 606, 650, and 708 nm, respectively. A strong luminescence in the orange-red region with chromaticity coordinates of (0.55, 0.38) was observed for the phosphor thin film deposited at 200 °C. These results suggest that the SrMoO$_{4}$:Sm$^{3+}$ phosphor thin film is a promising candidate as a red light-emitting phosphor for use in the fields of displays and lighting.
Starting Page	1006
Ending Page	1011
Page Count	6
File Format	PDF
ISSN	03744884
Journal	Journal of the Korean Physical Society
Volume Number	71
Issue Number	12
e-ISSN	19768524
Language	English
Publisher	The Korean Physical Society
Publisher Date	2017-07-31
Publisher Place	Seoul
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Deposition by sputtering Theoretical, Mathematical and Computational Physics Photoluminescence Defects and impurities Physics Particle and Nuclear Physics
Content Type	Text
Resource Type	Article
Subject	Physics and Astronomy

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