NDLI: Structural and optical properties of electron-beam-evaporated ZnSe $_{1−x }$Te$_{ x }$Ternary compounds with various Te contents

Content Provider	Springer Nature Link
Author	Suthagar, J. Sharli Nath, G. M. Suthan Kissinger, N. J. Perumal, K.
Copyright Year	2014
Abstract	ZnSe$_{1−x }$Te$_{ x }$ films with different tellurium (Te) contents were deposited by using an electron beam (EB) evaporation technique onto glass substrates for applications to optoelectronic devices. The structural and the optical properties of the ZnSe$_{1−x }$Te$_{ x }$ films were studied in the present work. The host material ZnSe$_{1−x }$Te$_{ x }$, were prepared by using the physical vapor deposition method of the electron beam evaporation technique (PVD: EBE) under a pressure of 1 × 10$^{−5}$ mbar. The X-ray diffractogram indicated that these alloy films had cubic structure with a strong preferential orientation of the crystallites along the (1 1 1) direction. The optical properties showed that the band gap (E$_{ g }$) values varied from 2.73 to 2.41 eV as the tellurium content varied from 0.2 to 0.8. Thus the material properties can be altered and excellently controlled by controlling the system composition x.
Starting Page	58
Ending Page	62
Page Count	5
File Format	PDF
ISSN	03744884
Journal	Journal of the Korean Physical Society
Volume Number	64
Issue Number	1
e-ISSN	19768524
Language	English
Publisher	Springer Netherlands
Publisher Date	2014-01-17
Publisher Place	Dordrecht
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Zinc selenide zinc telluride electron beam evaporation optical properties Theoretical, Mathematical and Computational Physics Physics Particle and Nuclear Physics
Content Type	Text
Resource Type	Article
Subject	Physics and Astronomy

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