NDLI: Microwave losses of undoped n-type silicon and undoped 4H-SiC single crystals at cryogenic temperatures

Content Provider	Springer Nature Link
Author	Jung, Ho Sang Yang, Woo Il Cho, Man Soon Joo, Kee Nam Lee, Sang Young
Copyright Year	2014
Abstract	We investigated microwave losses of single-crystalline Si and 4H-SiC at cryogenic temperatures at 8.6–24 GHz using a method involving a dielectric resonator with high-T $_{ c }$ superconductor YBa$_{2}$Cu$_{3}$O$_{7-δ }$ films used to improve the measurement sensitivity. The loss tangent of our undoped n-type Si appeared to be extremely low at temperatures below 20 K with a value of 1 × 10$^{−6}$ at 24 GHz at 10 K, which is more than 100 times lower than the value of 2 × 10$^{−4}$ at 6.8 GHz at 10 K reported by Krupka et al. [IEEE Trans. Microw. Theory Tech. 54, 3995 (2006)] for undoped p-type Si. Meanwhile, the loss tangent of pristine 4H-SiC appeared to be very high with a value of 0.01 at 10 K at 8.6 GHz, which is 4000 times higher than that of our undoped Si. When the pristine 4H-SiC was irradiated with thermal neutrons, the loss tangent was enhanced by seven times due to the significantly reduced electrical resistivity. Our results show that, at temperatures below 20 K, the loss tangent of undoped n-type Si is low enough for various cryogenic applications and that thermal neutron irradiation could provide a useful means of reducing the electrical resistivity of SiC possibly by means of neutron transmutation doping.
Starting Page	541
Ending Page	549
Page Count	9
File Format	PDF
ISSN	17388090
Journal	Electronic Materials Letters
Volume Number	10
Issue Number	3
e-ISSN	20936788
Language	English
Publisher	The Korean Institute of Metals and Materials
Publisher Date	2014-05-10
Publisher Place	Springer
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	silicon silicon carbide loss tangent microwave neutron Optical and Electronic Materials Condensed Matter Physics Nanotechnology and Microengineering Characterization and Evaluation of Materials Nanotechnology
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials

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