NDLI: Reliability prediction of semiconductor devices using modified physics of failure approach

Content Provider	Springer Nature Link
Author	Thaduri, Adithya Verma, Ajit Kumar Gopika, V. Gopinath, Rajesh Kumar, Uday
Copyright Year	2013
Abstract	Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predicting the reliability due to advancement in technology, process, materials etc. As predicting the reliability is the major concern in the field of electronics, physics of failure approach gained considerable importance as it involves investigating the root-cause which further helps in reliability growth by redesigning the structure, changing the parameters at manufacturer level and modifying the items at circuit level. On the other hand, probability and statistics methods provide quantitative data with reliability indices from testing by experimentation and by simulations. In this paper, qualitative data from PoF approach and quantitative data from the statistical analysis is combined to form a modified physics of failure approach. This methodology overcomes some of the challenges faced by PoF approach as it involves detailed analysis of stress factors, data modeling and prediction. A decision support system is added to this approach to choose the best option from different failure data models, failure mechanisms, failure criteria and other factors.
Starting Page	33
Ending Page	47
Page Count	15
File Format	PDF
ISSN	09756809
Journal	International Journal of System Assurance Engineering and Management
Volume Number	4
Issue Number	1
e-ISSN	09764348
Language	English
Publisher	Springer-Verlag
Publisher Date	2013-02-14
Publisher Place	India
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Physics of failure Reliability prediction Time to failure Failure mechanism Failure mode Failure modeling Quality Control, Reliability, Safety and Risk Engineering Economics, Organization, Logistics, Marketing
Content Type	Text
Resource Type	Article
Subject	Strategy and Management Safety, Risk, Reliability and Quality

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