NDLI: In situ thickness control of black phosphorus field-effect transistors via ozone treatment

Content Provider	Springer Nature Link
Author	Kim, Suhyun Jung, Younghun Lee, Jong Young Lee, Gwan Hyoung Kim, Jihyun
Copyright Year	2016
Abstract	A simple and reproducible method to control the thickness of black phosphorus flakes in real time using a UV/ozone treatment is demonstrated. Back-gated black phosphorus field-effect transistors (FETs) were fabricated using thick black phosphorus flakes obtained by thinning of black phosphorus, as oxygen radicals generated by UV irradiation formed phosphorus oxides on the surface. In order to monitor the thickness effect on the electrical properties, the fabricated FETs were loaded in the UV/ozone chamber, where both the optical (micro-Raman spectroscopy and optical microscopy) and electrical properties (current–voltage characteristics) were monitored in situ. We observed an intensity decrease of the Raman modes of black phosphorus while the field-effect mobility and on/off ratio increased by 48% and 6,800%, respectively. The instability in ambient air limits the investigation and implementation of ultra-thin black phosphorus. However, the method reported in this study allowed us to start with thick black phosphorous flakes, providing a reliable approach for optimizing the electrical performance of black phosphorus-based electronic devices. We believe that these results can motivate further studies using mono- and few-layer black phosphorus.
Starting Page	3056
Ending Page	3065
Page Count	10
File Format	PDF
ISSN	19980124
Journal	Nano Research
Volume Number	9
Issue Number	10
e-ISSN	19980000
Language	English
Publisher	Tsinghua University Press
Publisher Date	2016-08-25
Publisher Place	Beijing
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	black phosphorus in situ thinning UV/ozone treatment Nanotechnology Materials Science Atomic/Molecular Structure and Spectra Condensed Matter Physics Biotechnology Biomedicine
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering

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