NDLI: Evaporation and disjoining pressure of ultrathin film on substrate: a molecular dynamics study

Content Provider	Springer Nature Link
Author	Han, M.
Copyright Year	2012
Abstract	The equilibrium evaporation of the thin liquid film on a solid substrate is studied by performing molecular dynamics simulation (MD). The evaporation properties are obtained for a simple atomic system in three-phase coexistence and compared with those of the modeling methods based on the disjoining pressure. The thickness of the film is varied and goes down to as small as a few molecular diameters. The MD results show that the evaporation rate of the ultrathin film on a high-energy substrate is smaller than that of a macroscopic film because of the solid molecular potential effective over the film. The comparison with the mean field theory based on the kinetic theory of gases and the classical Hamaker theory of disjoining pressure shows a sizable discrepancy when the film thickness is comparable to the size of the interfacial region. The discrepancy mostly disappears when the disjoining pressure is derived by using the static properties from MD. This indicates that the evaporation modeling on ultrathin film of which the disjoining pressure is an integral part critically requires an accurate representation of the property.
Starting Page	2275
Ending Page	2284
Page Count	10
File Format	PDF
ISSN	1738494X
Journal	Journal of Mechanical Science and Technology
Volume Number	26
Issue Number	8
e-ISSN	19763824
Language	English
Publisher	Korean Society of Mechanical Engineers
Publisher Date	2012-08-23
Publisher Place	Heidelberg
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Equilibrium evaporation Noble gases Liquid layer Micro-layer Non-evaporating film Thin film Industrial and Production Engineering Vibration, Dynamical Systems, Control Mechanical Engineering
Content Type	Text
Resource Type	Article
Subject	Mechanics of Materials Mechanical Engineering

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