NDLI: Electrochemical properties of tungsten oxysulphide thin films as positive electrodes for lithium microbatteries

Content Provider	Springer Nature Link
Author	Martin Litas, I. Vinatier, P. Levasseur, A. Dupin, J. C. Gonbeau, D.
Copyright Year	2003
Abstract	Several WO$_{y}$S$_{z}$ tungsten oxysulphide thin films were tested as positive electrodes for lithium microbatteries. The amorphous WO$_{1.05}$S$_{2}$ thin film was found very promising. A capacity decrease occurred during the first few cycles, after which the films were able to intercalate reversibly up to 11 lithium ion per formula unit under high regime (75 μA/cm$^{2}$). They were tested for 250 charge-discharge cycles, between 30 V and 1.2 V. X-ray photoelectron spectroscopy measurements were performed on different compounds in both intercalated (Li$_{1}$WO$_{1.05}$S$_{2}$, Li$_{2.7}$WO$_{1.05}$S$_{2}$ and Li$_{3.8}$WO$_{1.05}$S$_{2}$) and partially deintercalated (Li$_{1}$WO$_{1.05}$S$_{2}$) states in order to understand the redox processes occurring during the first dischargecharge cycle. The analysis of both the W4f and the S2p peaks has shown that the redox processes involve not only the tungsten atoms but also sulphur atoms. At the beginning of the intercalation, W$^{6+}$ was first partially reduced into W$^{5+}$, and then into W$^{4+}$, but the important stage was the reduction of W$^{4+}$ into W$^{0}$. In W$^{0}$, the electron binding energy was very close to that of metallic tungsten. At the same time, S 2 2- ions were partially reduced into S$^{2-}$ ions. But only the reduction process of tungsten atoms appeared to be totally reversible.
Starting Page	673
Ending Page	681
Page Count	9
File Format	PDF
ISSN	02504707
Journal	Bulletin of Materials Science
Volume Number	26
Issue Number	7
e-ISSN	09737669
Language	English
Publisher	Springer India
Publisher Date	2003-01-01
Publisher Institution	Indian Academy of Sciences
Publisher Place	New Delhi
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Lithium microbattery tungsten oxysulphide thin film X- ay photoelectron spectroscopy (XPS) sputtering Materials Science Engineering
Content Type	Text
Resource Type	Article
Subject	Mechanics of Materials Materials Science

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