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  1. Optoelectronics, Instrumentation and Data Processing
  2. Optoelectronics, Instrumentation and Data Processing : Volume 52
  3. Optoelectronics, Instrumentation and Data Processing : Volume 52, Issue 2, March 2016
  4. Goodness-of-fit tests for uniformity of probability distribution law
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Optoelectronics, Instrumentation and Data Processing : Volume 53
Optoelectronics, Instrumentation and Data Processing : Volume 52
Optoelectronics, Instrumentation and Data Processing : Volume 52, Issue 5, September 2016
Optoelectronics, Instrumentation and Data Processing : Volume 52, Issue 4, July 2016
Optoelectronics, Instrumentation and Data Processing : Volume 52, Issue 3, May 2016
Optoelectronics, Instrumentation and Data Processing : Volume 52, Issue 2, March 2016
Multiagent control of computational systems on the basis of meta-monitoring and imitational simulation
Specific features of detecting point objects in images formed by a detector array
Program-combinatorial approach to solving problems of error-free readout of random point images
Goodness-of-fit tests for uniformity of probability distribution law
Passive identification of heat equation coefficients with account for errors in estimating the state of the object and measuring system
Femtosecond kinetics of reflection of mirrors with saturable absorption
Rotationally tunable two-beam interferometer with a fixed photosensitive element. Part I. Interferometer based on a beam-splitter cube
Optical diagnostics of vortex ring–flame interaction
Determination of the center composition of gradient-activated lithium niobate crystals doped with magnesium and chromium
Control of the optical properties of a CaCO$_{3}$ crystal in problems of generating bessel vortex beams by heating
Study of optical and thermo-optical properties of a hybrid photopolymer material based on thiol-siloxane and tetraacrylate oligomer
Automation system for the large solar vacuum telescope
Multi-channel control system design for a robot manipulator based on the time-scale method
Uncooled microbolometer mosaic focal plane arrays for the infrared and terahertz ranges
Micro-opto-electro-mechanical angular velocity transducer based on the optical tunneling effect
Optoelectronics, Instrumentation and Data Processing : Volume 52, Issue 1, January 2016
Optoelectronics, Instrumentation and Data Processing : Volume 51
Optoelectronics, Instrumentation and Data Processing : Volume 50
Optoelectronics, Instrumentation and Data Processing : Volume 49
Optoelectronics, Instrumentation and Data Processing : Volume 48
Optoelectronics, Instrumentation and Data Processing : Volume 47
Optoelectronics, Instrumentation and Data Processing : Volume 46
Optoelectronics, Instrumentation and Data Processing : Volume 45
Optoelectronics, Instrumentation and Data Processing : Volume 44
Optoelectronics, Instrumentation and Data Processing : Volume 43

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Goodness-of-fit tests for uniformity of probability distribution law

Content Provider Springer Nature Link
Author Lemeshko, B. Yu. Bliv, P. Yu. Lemeshko, S. B.
Copyright Year 2016
Abstract This paper describes a set of tests for uniformity of observations which are ranked by power. It is shown that most tests commonly used for the hypothesis of uniformity are biased relative to a certain kind of competing hypotheses. It is emphasized that specific tests meant only for uniformity have no obvious advantages over nonparametric goodness-of-fit tests used for the same purpose.
Starting Page 128
Ending Page 140
Page Count 13
File Format PDF
ISSN 87566990
Journal Optoelectronics, Instrumentation and Data Processing
Volume Number 52
Issue Number 2
e-ISSN 19347944
Language English
Publisher Allerton Press
Publisher Date 2016-06-16
Publisher Place New York
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword uniformity testing hypotheses statistical test test power Optics, Optoelectronics, Plasmonics and Optical Devices
Content Type Text
Resource Type Article
Subject Instrumentation Condensed Matter Physics Electrical and Electronic Engineering
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