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  1. Optoelectronics, Instrumentation and Data Processing
  2. Optoelectronics, Instrumentation and Data Processing : Volume 43
  3. Optoelectronics, Instrumentation and Data Processing : Volume 43, Issue 5, October 2007
  4. Measurement processing under multistructural interferences
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Optoelectronics, Instrumentation and Data Processing : Volume 53
Optoelectronics, Instrumentation and Data Processing : Volume 52
Optoelectronics, Instrumentation and Data Processing : Volume 51
Optoelectronics, Instrumentation and Data Processing : Volume 50
Optoelectronics, Instrumentation and Data Processing : Volume 49
Optoelectronics, Instrumentation and Data Processing : Volume 48
Optoelectronics, Instrumentation and Data Processing : Volume 47
Optoelectronics, Instrumentation and Data Processing : Volume 46
Optoelectronics, Instrumentation and Data Processing : Volume 45
Optoelectronics, Instrumentation and Data Processing : Volume 44
Optoelectronics, Instrumentation and Data Processing : Volume 43
Optoelectronics, Instrumentation and Data Processing : Volume 43, Issue 6, December 2007
Optoelectronics, Instrumentation and Data Processing : Volume 43, Issue 5, October 2007
Refining the outer camera orientation in synchronized shooting from two spacecrafts
Predictability time limit of autoregressive processes
Measurement processing under multistructural interferences
Selective effects of centroid filtering for noisy images
Nonparametric pattern recognition algorithms for random values of fuzziness factors of kernel functions
A method for synthesizing neural-network models under incomplete data
Angular selectivity of liquid crystal composite gratings
Determining the parameters of silicon ions implanted into dielectric layers by spectroscopic ellipsometry
Tunable single-frequency diode-pumped, intracavity-doubled, traveling-wave Nd:YAG and Yb:YAG lasers
Low-coherent autocorrelation interferometry of layered media
Optical Hilbert diagnostics of dynamic structures in gas flows
An optical method for detecting mechanical defects on high-grade-finish surfaces
A system for controlling laser writing devices
Optoelectronics, Instrumentation and Data Processing : Volume 43, Issue 4, August 2007
Optoelectronics, Instrumentation and Data Processing : Volume 43, Issue 3, June 2007
Optoelectronics, Instrumentation and Data Processing : Volume 43, Issue 2, April 2007
Optoelectronics, Instrumentation and Data Processing : Volume 43, Issue 1, February 2007

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Measurement processing under multistructural interferences

Content Provider Springer Nature Link
Author Bulychev, Yu. G. Eliseev, A. V.
Copyright Year 2007
Abstract The problem of processing measurements containing dynamic observation interferences is solved. The obtained method is invariant to piecewise continuous interferences of deterministic structures with unknown parameters. The method does not require extending the state space and speeds up solving the estimation problem.
Starting Page 408
Ending Page 418
Page Count 11
File Format PDF
ISSN 87566990
Journal Optoelectronics, Instrumentation and Data Processing
Volume Number 43
Issue Number 5
e-ISSN 19347944
Language English
Publisher Allerton Press, Inc.
Publisher Date 2007-01-01
Publisher Place New York
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Applied Optics, Optoelectronics, Optical Devices
Content Type Text
Resource Type Article
Subject Instrumentation Condensed Matter Physics Electrical and Electronic Engineering
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