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  1. Optoelectronics, Instrumentation and Data Processing
  2. Optoelectronics, Instrumentation and Data Processing : Volume 47
  3. Optoelectronics, Instrumentation and Data Processing : Volume 47, Issue 5, October 2011
  4. Infrared scanning microscope with high spatial resolution
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Optoelectronics, Instrumentation and Data Processing : Volume 53
Optoelectronics, Instrumentation and Data Processing : Volume 52
Optoelectronics, Instrumentation and Data Processing : Volume 51
Optoelectronics, Instrumentation and Data Processing : Volume 50
Optoelectronics, Instrumentation and Data Processing : Volume 49
Optoelectronics, Instrumentation and Data Processing : Volume 48
Optoelectronics, Instrumentation and Data Processing : Volume 47
Optoelectronics, Instrumentation and Data Processing : Volume 47, Issue 6, December 2011
Optoelectronics, Instrumentation and Data Processing : Volume 47, Issue 5, October 2011
Development of methods and instruments for optical ellipsometry at the Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences
Growing of HgCdTe heterostructures with in situ ellipsometric control
Emitters based on semiconductor Bragg microcavities
Effect of electron trapping centers on electrical and photoelectric properties of PbSnTe : In
Formation of type-II InAs/GaSb strained short-period superlattices for IR photodetectors by molecular beam epitaxy
Oxidation kinetics of a silicon surface in a plasma of oxygen with inert gases
Optical properties and morphology of diamond-like films obtained in a supersonic flow of a hydrocarbon plasma
Ellipsometric monitoring in label-free microarray biotechnologies
Estimation of the ultimate efficiency of a three-pin solar cell based on the GaAs/Si heterostructure
Dependences of the optical characteristics of Al$_{ x }$Ga$_{1−x }$N films on the substrate composition and polarity
Modeling the formation of silicon nanoclusters during annealing SiO$_{ x }$ layers
Infrared scanning microscope with high spatial resolution
Calibration of photodetectors in IR microscopes
Application of uncooled microbolometer detector arrays for recording radiation of the terahertz spectral range
Application of ellipsometry for studying bio-organic media
Automated system for measuring electrical and recombination-diffusion parameters of charge carriers in p-type mercury-cadmium-tellurium films
Optoelectronics, Instrumentation and Data Processing : Volume 47, Issue 4, August 2011
Optoelectronics, Instrumentation and Data Processing : Volume 47, Issue 3, June 2011
Optoelectronics, Instrumentation and Data Processing : Volume 47, Issue 2, April 2011
Optoelectronics, Instrumentation and Data Processing : Volume 47, Issue 1, February 2011
Optoelectronics, Instrumentation and Data Processing : Volume 46
Optoelectronics, Instrumentation and Data Processing : Volume 45
Optoelectronics, Instrumentation and Data Processing : Volume 44
Optoelectronics, Instrumentation and Data Processing : Volume 43

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Infrared scanning microscope with high spatial resolution

Content Provider Springer Nature Link
Author Bazovkin, V. M. Mzhel’skii, I. V. Kuryshev, G. L. Polovinkin, V. G.
Copyright Year 2011
Abstract Technical parameters and possible applications of an infrared scanning microscope with a spatial resolution of up to 3 µm are considered. It is shown that the device works with both array and linear photodetectors. Original PC software was designed to control the scanning process interactively and receive and process images of objects in the infrared range,.
Starting Page 498
Ending Page 502
Page Count 5
File Format PDF
ISSN 87566990
Journal Optoelectronics, Instrumentation and Data Processing
Volume Number 47
Issue Number 5
e-ISSN 19347944
Language English
Publisher Allerton Press, Inc.
Publisher Date 2012-01-28
Publisher Place Heidelberg
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword infrared microscope scanning system software photodetector Optics, Optoelectronics, Plasmonics and Optical Devices
Content Type Text
Resource Type Article
Subject Instrumentation Condensed Matter Physics Electrical and Electronic Engineering
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