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  1. Optoelectronics, Instrumentation and Data Processing
  2. Optoelectronics, Instrumentation and Data Processing : Volume 49
  3. Optoelectronics, Instrumentation and Data Processing : Volume 49, Issue 1, January 2013
  4. Statistical model of exchange rate formation
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Optoelectronics, Instrumentation and Data Processing : Volume 53
Optoelectronics, Instrumentation and Data Processing : Volume 52
Optoelectronics, Instrumentation and Data Processing : Volume 51
Optoelectronics, Instrumentation and Data Processing : Volume 50
Optoelectronics, Instrumentation and Data Processing : Volume 49
Optoelectronics, Instrumentation and Data Processing : Volume 49, Issue 6, November 2013
Optoelectronics, Instrumentation and Data Processing : Volume 49, Issue 5, September 2013
Optoelectronics, Instrumentation and Data Processing : Volume 49, Issue 4, July 2013
Optoelectronics, Instrumentation and Data Processing : Volume 49, Issue 3, May 2013
Optoelectronics, Instrumentation and Data Processing : Volume 49, Issue 2, March 2013
Optoelectronics, Instrumentation and Data Processing : Volume 49, Issue 1, January 2013
Model of a persistent photodetector for analyzing the threshold sensitivity in the problem of detection of a moving point object
Detection of dynamic objects on the basis of space-time anomalies in video sequences
Method of choosing the best distribution law for a random variable based on experimental data
Algorithms of calculating of approximating spline functions with optimization of the location of spline nodes
Application of the fractal dimension for estimating surface images obtained by various detectors
Statistical model of exchange rate formation
Parametric synthesis of technical systems based on the linear approximation of the operational capability range
Method of optical tomography for studying the amplitude and phase components of a volume golographic grating
Experimental study of a model system of dynamic scene generation for testing infrared imaging systems
Diffractive attenuators of laser radiation: Fabrication and optical characteristics
Microbeam X-ray lithography apparatus for direct production of deep LIGA structures
Magneto-optical resonances in cells with an antirelaxation coating for elliptically polarized radiation
Increasing the mechanical strength of hybrid photodetectors based on mercury-cadmium-telluride heteroepitaxial layers
Response of nanowire sensors to adsorption of neutral particles
Optoelectronics, Instrumentation and Data Processing : Volume 48
Optoelectronics, Instrumentation and Data Processing : Volume 47
Optoelectronics, Instrumentation and Data Processing : Volume 46
Optoelectronics, Instrumentation and Data Processing : Volume 45
Optoelectronics, Instrumentation and Data Processing : Volume 44
Optoelectronics, Instrumentation and Data Processing : Volume 43

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Statistical model of exchange rate formation

Content Provider Springer Nature Link
Author Kuleshov, E. L.
Copyright Year 2013
Abstract The exchange rate formation process is represented as the sum of a low-frequency deterministic trend and a high-frequency stationary random component for which the covariance function, the spectral density, and the increment correlation function are obtained. Theoretical results are in good agreement with the results of processing of observed data. The model explains the occurrence of Elliott waves on exchange rate paths and generates a parametric family of random processes with spectral characteristics ranging from white noise to a first-order autoregression process.
Starting Page 41
Ending Page 50
Page Count 10
File Format PDF
ISSN 87566990
Journal Optoelectronics, Instrumentation and Data Processing
Volume Number 49
Issue Number 1
e-ISSN 19347944
Language English
Publisher Allerton Press, Inc.
Publisher Date 2013-04-06
Publisher Place Heidelberg
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword random process exchange rate covariance function spectral density autoregression processes Elliott waves Optics, Optoelectronics, Plasmonics and Optical Devices
Content Type Text
Resource Type Article
Subject Instrumentation Condensed Matter Physics Electrical and Electronic Engineering
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