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| Content Provider | Springer Nature Link |
|---|---|
| Author | Kaur, Amandeep Singh, Chandan |
| Copyright Year | 2013 |
| Abstract | Cephalometry is an essential clinical and research tool in orthodontics. It has been used for decades to obtain absolute and relative measures of the craniofacial skeleton. Since manual identification of predefined anatomical landmarks is a very tedious approach, there is a strong need for automated methods. This paper explores the use of Zernike moment-based global features for initial landmark estimation and computing small expectation window for each landmark. Using this expectation window and local template matching based on ring and central projection method, a closer approximation of landmark position is obtained. A smaller search window based on this approximation is used to find the exact location of landmark positions based on template matching using a combination of sum of squared distance and normalized cross-correlation. The system was tested on 18 commonly used landmarks using a dataset of 85 randomly selected cephalograms. A total of 89.5 % of the localization of 18 selected landmarks are within a window of $$\le \!\!\pm 2\text{ mm}$$ . The average mean error for the 18 landmarks is 1.84 mm and average SD of mean error is 1.24. |
| Starting Page | 117 |
| Ending Page | 132 |
| Page Count | 16 |
| File Format | |
| ISSN | 18631703 |
| Journal | Signal, Image and Video Processing |
| Volume Number | 9 |
| Issue Number | 1 |
| e-ISSN | 18631711 |
| Language | English |
| Publisher | Springer London |
| Publisher Date | 2013-03-06 |
| Publisher Place | London |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Cephalometry Landmarks Zernike moments Central projections Template matching Signal, Image and Speech Processing Image Processing and Computer Vision Computer Imaging, Vision, Pattern Recognition and Graphics Multimedia Information Systems |
| Content Type | Text |
| Resource Type | Article |
| Subject | Signal Processing Electrical and Electronic Engineering |
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