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  1. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
  2. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5
  3. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 5, October 2011
  4. Coplanar three-beam X-ray diffraction study in TeO$_{2}$ single crystal using synchrotron radiation
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Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 11
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 10
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 9
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 8
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 7
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 6
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 6, December 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 5, October 2011
Mikhail Valentinovich Kovalchuk on his 65th birthday
Spectral-selective X-ray methods for structure diagnostics of ordered bioorganic nanosystems on a liquid surface
Coplanar three-beam X-ray diffraction study in TeO$_{2}$ single crystal using synchrotron radiation
Synchrotron and neutron-scattering methods for studies of properties of condensed matter: Competition or complementarity?
The microstructure of vertically coupled quantum dots ensembles by EXAFS spectroscopy
Study of physicochemical and biological properties of calcium phosphate coatings prepared by RF magnetron sputtering of silicon-substituted hydroxyapatite
Simulation of growth of silicon nanowhiskers with Ge-Si heterojunctions
Connection of Gibbs layer gatherings with rate of mass transfer upon deposition of thin films with presence of impurity
On the theory of X-ray coherent reflection from a rough surface
Application of a focused ion beam to prepare electron microscopy samples of surface nanostructures
Study of nanostructures on a solar cell surface exposed on the Mir orbital station
Radiation effect on the electrophysical properties of some oxide dielectric materials
Imaging of a test object with a trapezoidal profile and large side wall inclinations in a scanning electron microscope in the backscattered electron mode
Revelation of the microstructure of oxide FeAl/Al$_{2}$O$_{3}$ nanocomposite
Studies of structure and composition of a Pt-based basic electrode for deposition of PZT ferroelectric films on silicon substrates
Electron probe microanalysis of HgCdTe heteroepitaxial structures with CdTe buffer layers
Optical properties of 1D metal nanogratings
Study of the effect of irradiation with the SEM electron beam on cathodoluminescence and the induced current in InGaN/GaN structures with multiple quantum wells
Study of solar silicon multicrystals by SEM and EPMA methods
SEM Investigation of the electrical properties of silicon ribbons
Synchrotron investigations of electronic and atomic-structure peculiarities for silicon-oxide films’ surface layers containing silicon nanocrystals
Thermostimulated surface autosegregation in bismuth ferrite single crystals
Formation of surface gradient structural-phase states under electron-beam treatment of stainless steel
Mutual electrosurface transfer and phase formation at the MeWO$_{4}$|WO$_{3}$ (Me = Ca, Sr, Ba) interface: Electron microscopy data
Microstructure and properties of single-crystal rare-earth oxide fibers
Technique for investigating the spatial structure of thin films at a nanolevel
Study of phase transformations in the Si$_{67}$Fe$_{33}$ thin-film system upon steady-state annealing
Effect of drying temperature on sizes and morphology of goethite nanoparticles
Chemical composition and surface morphology of anodic alumina determined by electron microscopy and thermogravimetry
Grain structure and texture of rapidly solidified foils of tin and its alloys
Application of Fourier analysis of scanning electron microscopy images for studying variation features of reservoir properties of carbonate rocks at stages of catagenetic transformations
Erratum to: “Calculation of the Electronic Structure of Metal Island Films”
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 4, August 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 3, June 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 2, April 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5, Issue 1, February 2011
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 3
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 2
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1

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Coplanar three-beam X-ray diffraction study in TeO$_{2}$ single crystal using synchrotron radiation

Content Provider Springer Nature Link
Author Blagov, A. E. Koval’chuk, M. V. Kohn, V. G. Mukhamedzhav, E. Kh. Pisarevsky, Yu. V. Prosekov, P. A.
Copyright Year 2011
Abstract The results of the first experimental study of coplanar three-beam X-ray diffraction in a paratellurite (TeO$_{2}$) single crystal using synchrotron radiation on a Kurchatov synchrotron radiation source are presented. Four cases with (220, 371), (220, 464), (220, 370), and (110, 557) indices have been investigated. In all cases the change of the rocking curve shape of the weak reflection has been observed due to the multibeam interaction resulting in the appearance of two peaks in the reflection curve corresponding to two scattering mechanisms: amplitude and resonance. The origin of the insufficient resolution in the experiments has been considered. It has been shown that the obtained data correspond to the results of the computer simulation.
Starting Page 822
Ending Page 827
Page Count 6
File Format PDF
ISSN 10274510
Journal Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number 5
Issue Number 5
e-ISSN 18197094
Language English
Publisher SP MAIK Nauka/Interperiodica
Publisher Date 2011-10-08
Publisher Place Dordrecht
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Surfaces and Interfaces, Thin Films
Content Type Text
Resource Type Article
Subject Nanoscience and Nanotechnology Surfaces, Coatings and Films
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