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  1. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
  2. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1
  3. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1, Issue 2, April 2007
  4. Defect sites in thin films of germanium dioxide irradiated with silicon ions
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Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 11
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 10
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 9
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 8
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 7
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 6
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 3
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 2
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1, Issue 6, December 2007
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1, Issue 5, October 2007
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1, Issue 4, August 2007
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1, Issue 3, June 2007
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1, Issue 2, April 2007
Temperature dependences of the ion-electron emission of glassy carbons under 30-keV argon ion irradiation
Defect sites in thin films of germanium dioxide irradiated with silicon ions
Concentration dependence of Fe segregation near the surface in V-Fe alloys after V$^{+}$ ion irradiation
Study of the interaction of argon and nitrogen ions with the silicon dioxide surface
Contribution of the second-order born approximation to the coherent bremsstrahlung cross section by relativistic electrons and positrons in crystals
Study of cross sections for the loss of outer 1s, 2s, and 2p electrons by fast ions and atoms of light elements
Features of energy loss for ions with K vacancy
Analytical model of transversal cooling and heating of channeled ions
New nature of the noise of thermally stimulated electron emission from rods under cyclic torsion
Generation of intense directional radiation during the fast motion of a liquid jet through a narrow dielectric channel
Computer simulation of the dechanneling of low-energy protons and antiprotons passing through a crystal
Ranges of implanted atoms under polyatomic cluster bombardment of the Cu (111) surface
Study of the possible charge bistability of a hydrogen H*$_{2}$ defect
Role of hydrogen in the absorption of ionizing radiation energy by a metal-hydrogen system
Features of the X-ray radiation of interacting multiply charged clusters
Formation of preferred orientations in aluminum, copper, and nickel irradiated with intense ion beams
Changes in the silicon microhardness induced by a low-intensity electron beam
Monte Carlo simulation of ion-beam doping of a silicon-on-sapphire heterostructure with regard to the dislocation structure
Quantum-size effects on the characteristics of single-electron tunneling
On the eikonal approximation in the theory of transition radiation
Binomial potential of the electron-proton interaction as an alternative to the Coulomb law
Optical properties of polycrystalline alumina after irradiation with iron ions and annealing
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1, Issue 1, February 2007

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Defect sites in thin films of germanium dioxide irradiated with silicon ions

Content Provider Springer Nature Link
Author Gorshkov, O. N. Tetel’baum, D. I. Antov, I. N. Mikhailov, A. N. Kamin, V. A. Kasatkin, A. P.
Copyright Year 2007
Abstract Optical transmission spectra of GeO$_{2}$ films irradiated with silicon ions and subjected to postimplantation annealing in the regime of silicon nanocrystal formation are analyzed. It is shown that point defects form in the films after irradiation with doses D ∼ 10$^{20}$ m$^{−2}$: germanium electron centers, neutral oxygen vacancies, and Ge$^{2+}$ centers, which have been annealed at a temperature of 1000°C for an hour. At D ≥ 1 × 10$^{21}$ m$^{−2}$, more complex defects arise in the films, which are only partially annealed under the same conditions.
Starting Page 127
Ending Page 129
Page Count 3
File Format PDF
ISSN 10274510
Journal Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number 1
Issue Number 2
e-ISSN 18197094
Language English
Publisher Nauka/Interperiodica
Publisher Date 2007-01-01
Publisher Place Moscow
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Surfaces and Interfaces, Thin Films
Content Type Text
Resource Type Article
Subject Nanoscience and Nanotechnology Surfaces, Coatings and Films
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