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  1. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
  2. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4
  3. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 5, October 2010
  4. Thin film semiconductor islands and numerical experiment
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Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 11
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 10
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 9
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 8
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 7
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 6
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 5
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 6, November 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 5, October 2010
Features of the formation of a perovskite phase in thin polycrystalline Pb(Zr,Ti)O$_{3}$ films
Comparison of extended-defect contrasts calculated in the XBIC and EBIC methods
AFM investigation of films based on UV-solidified powder oligoesterdimethacrylate compositions
Fabrication of specified-geometry metal pattern by proton irradiation through a single-layer mask
Evolution of the phase-structure state during annealing of Fe-ZrN films grown by magnetron sputtering
Development of the method of electron-optical in situ monitoring for periodic structures
Periodic domain structures obtained by growth of LiNbO$_{3}$ crystals doped with gadolinium
Electron microscopy investigation of AlMg6 aluminum alloy surface defects caused by microorganisms extracted in space stations
Investigations of electron beam induced conductivity in silicon oxide thin films
Comparative study of cathode and magnetron sputtering methods for depositing Pb(TiZr)O$_{3}$ ferroelectric film
Study of elemental and phase composition of PZT thin films by auger depth profiling
Study of irradiated superconducting films by SPM techniques
Oriented surface self-segregation in lead titanate single crystals
On the technique of absolutization of diffuse scattering intensity measurements based on thermal diffuse scattering measurements
On one possibility of the mathematical modeling of the dependence of cathodoluminescence intensity on the energy of beam electrons with the use of the power series approximation in the problem of identifying the parameters of semiconductor materials
SIMS diagnostics of the structure of nanometer-sized semiconducting layers doped with impurities
Peculiarities of electron exchange between a negative hydrogen ion and atomic chains
Scanning helium ion microscope: Distribution of secondary electrons and ion channeling
Investigation into the formation of X-ray photopolymer lenses
Formation of nanostructures on the surface of polymer films by an atomic force microscope tip
Use of cluster secondary ions for minimization of matrix effects in the SIMS depth profiling of La/B$_{4}$C multilayer nanostructures
Oriented surface autosegregation in the lead germanate single crystals
The effect of heating on optical properties and radiation resistance of coatings based on micro- and nanosized aluminum oxide powders
Diffracted channeling radiation for axial electron channeling
Kinetics of the formation of gas bubbles during polarization of copper and graphite electrodes in electrolytic aqueous solutions
Thin film semiconductor islands and numerical experiment
Radiation damage of material surfaces under prolonged irradiation with He$^{+}$ and Ar$^{+}$ ions with broad energy spectra
Ion-implanted deuterium accumulation in a deposited tungsten coating
The Schottky barrier at homogeneous impurity distribution in a semiconductor
Interfacial polarization in statistical mixtures
Partial local connectivity on different surfaces
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 4, August 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 3, June 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 2, April 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 4, Issue 1, February 2010
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 3
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 2
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques : Volume 1

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Thin film semiconductor islands and numerical experiment

Content Provider Springer Nature Link
Author Zmievskaya, G. I. Bondareva, A. L.
Copyright Year 2010
Abstract The distribution functions of island nuclei of germanium melt drops on Si(100) substrate over lateral sizes and heights in the presence of a surface linear defect are obtained in a numerical experiment simulating the initial stage of the first-order phase transition. A similar model of heterogeneous condensation of silicon carbide vapor is discussed. Quasi-linear kinetic partial differential equations are solved by the efficient numerical method of stochastic analogue of nonequilibrium processes. The Volmer-Weber mechanism of cluster formation from melt islands, their crystallization, and island structure formation on the substrate are considered.
Starting Page 836
Ending Page 844
Page Count 9
File Format PDF
ISSN 10274510
Journal Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number 4
Issue Number 5
e-ISSN 18197094
Language English
Publisher SP MAIK Nauka/Interperiodica
Publisher Date 2010-10-12
Publisher Place Dordrecht
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Surfaces and Interfaces, Thin Films
Content Type Text
Resource Type Article
Subject Nanoscience and Nanotechnology Surfaces, Coatings and Films
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