NDLI: Computer simulation of phase-contrast images in white synchrotron radiation using micropipes in silicon carbide

Content Provider	Springer Nature Link
Author	Arguva, T. S. Kohn, V. G. Je, Jung Ho
Copyright Year	2008
Abstract	A method of computer simulation of phase-contrast images in white synchrotron radiation has been developed to determine the section parameters of micropipes in silicon carbide. The experiments have been carried out using the third-generation synchrotron radiation source the Pohang Light Source (South Korea). The effective spectrum of the synchrotron radiation that forms of an image has been shown to have a relatively sharp maximum at an energy of 16 keV, which makes it possible to conserve coherency within the required limits. A computer program has been developed that automatically determines the diameters of an elliptic section of a micropipe from the condition of coincidence of calculated and experimental profiles. It has been shown that the studied micropipes have a strongly stretched elliptic section that can twist when moving along the pipe axis.
Starting Page	861
Ending Page	865
Page Count	5
File Format	PDF
ISSN	10274510
Journal	Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number	2
Issue Number	6
e-ISSN	18197094
Language	English
Publisher	SP MAIK Nauka/Interperiodica
Publisher Date	2008-12-17
Publisher Place	Dordrecht
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Surfaces and Interfaces, Thin Films
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Surfaces, Coatings and Films

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Computer simulation of phase-contrast images in white synchrotron radiation using micropipes in silicon carbide