NDLI: Measurement of radiation energy by spectrometric systems based on uncooled silicon detectors

Content Provider	Springer Nature Link
Author	Vasiliev, G. P. Voloshyn, V. K. Deiev, O. S. Kiprich, S. K. Maslov, N. I. Naumov, S. V. Ovchinnik, V. D. Potin, S. M. Shulika, M. Y. Yalovenko, V. I.
Copyright Year	2014
Abstract	The results of measurements of radiation energy for single-channel detection systems based on uncooled silicon planar detectors and spectrometric readout electronics, developed at the Kharkiv Institute of Physics and Technology National Scientific Center, are presented. Radiation sources of $^{55}$Fe, $^{241}$Am, $^{57}$Co, $^{137}$Cs, and $^{99M}$Tc and characteristic X-ray radiation (CXR) are used in the experiments. The radiation energy in the range of E $_{γ}$ = 3–140 keV is measured by a spectrometer based on a Si PIN detector. The energy resolution (full width at half maximum, FWHM) in this energy range changes with increasing photon energy from 0.97 to 1.3 keV. The CXR of calcium (K $_{α}$ = 3.69 keV) is measured by a Si planar detector with an input aluminum foil. Emission lines in the energy range of E $_{γ}$ = 0.04–0.662 MeV are measured by a CsI(Tl) scintillator-silicon PIN-photodiode detection system. The energy resolution of the spectrometer changes with quantum energy increasing from 22 to 70 keV. The CXR from cesium and iodine with K $_{α}$ 31 and 28.6 keV, respectively, is recorded.
Starting Page	391
Ending Page	397
Page Count	7
File Format	PDF
ISSN	10274510
Journal	Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
Volume Number	8
Issue Number	2
e-ISSN	18197094
Language	English
Publisher	Pleiades Publishing
Publisher Date	2014-04-22
Publisher Place	Moscow
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Surfaces and Interfaces, Thin Films
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Surfaces, Coatings and Films

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