NDLI: The use of XPS, FTIR, SEM/EDX, contact angle, and AFM in the characterization of coatings

Content Provider	Springer Nature Link
Author	Walzak, M. J. Davidson, R. Biesinger, M.
Copyright Year	1998
Abstract	Coatings are applied to surfaces for a variety of reasons: to enhance their appearance, to protect the substrate, to augment the adhesion to other layers, or to functionalize them for further reactions. To evaluate the efficacy of the coating, it is often necessary to analyze the substrate and the coating to ensure that the needed characteristics are present. To this end, the use of x-ray photoelectron spectroscopy (XPS), contact angle, and atomic force microscopy (AFM) can provide information about the surface composition, its morphology, and its ability to be wetted with various solvents. Scanning electron microscopy with energy dispersive x-ray analysis (SEM/EDX) and Fourier transform infrared spectroscopy (FTIR) can provide a clear picture of the near surface components as well as the continuity of coatings. All of these aspects are valuable in evaluating a coating and essential when problems are encountered. The application of these techniques to the analysis of coatings is discussed.
Starting Page	317
Ending Page	323
Page Count	7
File Format	PDF
ISSN	10599495
Journal	Journal of Materials Engineering and Performance
Volume Number	7
Issue Number	3
e-ISSN	15441024
Language	English
Publisher	Springer-Verlag
Publisher Date	1998-01-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	coatings failure analysis scanning electron microscopy Characterization and Evaluation of Materials Materials Science Tribology, Corrosion and Coatings Quality Control, Reliability, Safety and Risk Engineering Design
Content Type	Text
Resource Type	Article
Subject	Mechanics of Materials Materials Science Mechanical Engineering

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