NDLI: Atomic force microscopy study of biaxially oriented polypropylene films

Content Provider	Springer Nature Link
Author	Nie, H. Y. Walzak, M. J. McIntyre, N. S.
Copyright Year	2004
Abstract	Atomic force microscopy (AFM) uses a very sharp pointed mechanical probe to collect real-space morphological information of solid surfaces. AFM was used in this study to image the surface morphology of a biaxially oriented polypropylene film. The polymer film is characterized by a nanometer-scale, fiberlike network structure, which reflects the drawing process used during the fabrication of the film. AFM was used to study polymer-surface treatment to improve wettability by exposing the polymer to ozone with or without ultraviolet (UV) irradiation. Surface-morphology changes observed by AFM are the result of the surface oxidation induced by the treatment. Due to the topographic features of the polymer film, the fiberlike structure has been used to check the performance of the AFM tip. An AFM image is a mixture of the surface morphology and the shape of the AFM tip. Therefore, it is important to check the performance of a tip to ensure that the AFM image collected reflects the true surface features of the sample, rather than contamination on the AFM tip.
Starting Page	451
Ending Page	460
Page Count	10
File Format	PDF
ISSN	10599495
Journal	Journal of Materials Engineering and Performance
Volume Number	13
Issue Number	4
e-ISSN	15441024
Language	English
Publisher	Springer-Verlag
Publisher Date	2004-01-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	AFM tip effect atomic force microscopy (AFM) biaxially oriented polypropylene (BOPP) check tip performance using BOPP surface morphology UV/ozone treatment Characterization and Evaluation of Materials Materials Science Tribology, Corrosion and Coatings Quality Control, Reliability, Safety and Risk Engineering Design
Content Type	Text
Resource Type	Article
Subject	Mechanics of Materials Materials Science Mechanical Engineering

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