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  1. Journal of Electronic Materials
  2. Journal of Electronic Materials : Volume 26
  3. Journal of Electronic Materials : Volume 26, Issue 9, September 1997
  4. Foreword
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Journal of Electronic Materials : Volume 46
Journal of Electronic Materials : Volume 45
Journal of Electronic Materials : Volume 44
Journal of Electronic Materials : Volume 43
Journal of Electronic Materials : Volume 42
Journal of Electronic Materials : Volume 41
Journal of Electronic Materials : Volume 40
Journal of Electronic Materials : Volume 39
Journal of Electronic Materials : Volume 38
Journal of Electronic Materials : Volume 37
Journal of Electronic Materials : Volume 36
Journal of Electronic Materials : Volume 35
Journal of Electronic Materials : Volume 34
Journal of Electronic Materials : Volume 33
Journal of Electronic Materials : Volume 32
Journal of Electronic Materials : Volume 31
Journal of Electronic Materials : Volume 30
Journal of Electronic Materials : Volume 29
Journal of Electronic Materials : Volume 28
Journal of Electronic Materials : Volume 27
Journal of Electronic Materials : Volume 26
Journal of Electronic Materials : Volume 26, Issue 12, December 1997
Journal of Electronic Materials : Volume 26, Issue 1, December 1997
Journal of Electronic Materials : Volume 26, Issue 11, November 1997
Journal of Electronic Materials : Volume 26, Issue 10, October 1997
Journal of Electronic Materials : Volume 26, Issue 9, September 1997
Foreword
Molecular view of diamond CVD growth
Surface and interface stress effects on the growth of thin films
Real-time stress evolution during Si$_{1-x}$Ge$_{x}$ Heteroepitaxy: Dislocations, islanding, and segregation
Adhesion of CVD tin on 316l surgical stainless steel obtained in a mass transfer regime
Some further microstructural characteristics of face-centered cubic polycrystalline metal thin films
Local textures and grain boundaries in voided copper interconnects
Elastic modulus measurement of thin film using a dynamic method
Evolution of grain structure in thin film reactions ( Journal of Electronic Materials , Volume 26 , Issue 9 )
Stress relaxation and thermal evolution of film properties in amorphous carbon
Glancing-angle ion bombardment for modification and monitoring of semiconductor surfaces
Mechanisms of strain induced roughening and dislocation multiplication in Si$_{x}$Ge$_{1-x}$thin films
Spontaneous lateral composition modulation in AlAs/InAs short period superlattices via the growth front
Structural stability of low temperature grown InGaAs/GaAs heterostructure
Fatigue-creep crack propagation path in solder joints under thermal cycling
Analysis of iodine incorporation in mbe grown CdTe and HgCdTe
Electromigration in aluminum/silicon/copper metallization due to the presence of a thin oxide layer
Characteristics of Si$_{3}$N$_{4}$/GaAs metal-lnsulator-semiconductor interfaces with coherent Si/Al$_{0.3}$Ga$_{0.7}$As interlayers
Continuous in situ growth rate extraction using pyrometric interferometry and laser reflectance measurement during molecular beam epitaxy
Crystallographic texture of C54 titanium disilicide as a function of deep submicron structure geometry
Journal of Electronic Materials : Volume 26, Issue 8, August 1997
Journal of Electronic Materials : Volume 26, Issue 7, July 1997
Journal of Electronic Materials : Volume 26, Issue 6, June 1997
Journal of Electronic Materials : Volume 26, Issue 5, May 1997
Journal of Electronic Materials : Volume 26, Issue 4, April 1997
Journal of Electronic Materials : Volume 26, Issue 3, March 1997
Journal of Electronic Materials : Volume 26, Issue 2, February 1997

Foreword

Content Provider Springer Nature Link
Copyright Year 1997
Starting Page 959
Ending Page 959
Page Count 1
File Format PDF
ISSN 03615235
Journal Journal of Electronic Materials
Volume Number 26
Issue Number 9
e-ISSN 1543186X
Language English
Publisher Springer-Verlag
Publisher Date 1997-01-01
Publisher Place New York
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Optical and Electronic Materials Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Solid State Physics and Spectroscopy
Content Type Text
Subject Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering
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