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| Content Provider | Springer Nature Link |
|---|---|
| Author | Xiao, Qiang Armstrong, William D. |
| Copyright Year | 2005 |
| Abstract | The microstructural and creep behavior of bulk 63SnPb37 and the Pb-free solder alloy Sn3.9Ag0.6Cu are reported and compared. The Sn3.9Ag0.6Cu alloy showed much lower absolute creep rates than 63SnPb37. The size and distribution of the intermetallic compound (IMC) coarsened with increasing creep temperature. A number of coarsened precipitates of Cu$_{6}$Sn$_{5}$ segregate around β-Sn grain boundaries. After creep at 80°C and 115°C. the β-Sn particles in the Sn3.9Ag0.6Cu alloy are strongly aligned at approximately 45° to the uniaxial tension, parallel to the maximum shear-stress planes. The powerlaw-defined stress exponent significantly increases with increasing stress in both the 63Sn37Pb and Sn3.9Ag0.6Cu alloys; therefore, the Dorn model is unsuitable for these materials over large stress and temperature ranges. Both sets of experimental data were successfully fit with the present power-law stress-dependent energy-barrier model and the Garofalo model. However, the application of the present power-law stress-dependent energy model resulted in a significantly lower estimated variance as compared to the Garofalo model. |
| Starting Page | 196 |
| Ending Page | 211 |
| Page Count | 16 |
| File Format | |
| ISSN | 03615235 |
| Journal | Journal of Electronic Materials |
| Volume Number | 34 |
| Issue Number | 2 |
| e-ISSN | 1543186X |
| Language | English |
| Publisher | Springer-Verlag |
| Publisher Date | 2005-01-01 |
| Publisher Place | New York |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Lead-free solder creep constitutive model microstructural changes Optical and Electronic Materials Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Solid State Physics and Spectroscopy |
| Content Type | Text |
| Resource Type | Article |
| Subject | Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering |
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