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| Content Provider | Springer Nature Link |
|---|---|
| Author | Moazzami, K. Liao, D. Phillips, J. D. Lee, D. L. Carmody, M. Zandian, M. Edwall, D. D. |
| Copyright Year | 2003 |
| Abstract | Hg$_{1−x}$Cd$_{x}$Te is an important material for high-performance infrared detection for a wide spectral range, from 1.7 µm to beyond 14 µm. An accurate understanding of the relationship between optical absorption and bandgap energy of this semiconductor alloy is needed for pre-process layer screening, detector design, and interpretation of detector performance. There is currently a disparity among the infrared detector community in relating the optical absorption properties to HgCdTe alloy composition and bandgap energy. This disagreement may stem from a misunderstanding of absorption properties, where existing models were developed decades ago using either bulk material or material with nonuniform composition. In this work, we have initiated an investigation of the optical absorption properties of HgCdTe with uniform composition grown by molecular-beam epitaxy (MBE) with in-situ compositional control via spectroscopic ellipsometry. The absorption properties show unique characteristics in the bandtail region, with insignificant temperature dependence. The absorption properties above the bandgap suggest a hyperbolic bandstructure as opposed to the common assumption of a parabolic bandstructure. The temperature dependence of the bandgap energy shows good agreement to the commonly used expression developed previously by Hansen et al. |
| Starting Page | 646 |
| Ending Page | 650 |
| Page Count | 5 |
| File Format | |
| ISSN | 03615235 |
| Journal | Journal of Electronic Materials |
| Volume Number | 32 |
| Issue Number | 7 |
| e-ISSN | 1543186X |
| Language | English |
| Publisher | Springer-Verlag |
| Publisher Date | 2003-01-01 |
| Publisher Place | New York |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | HgCdTe optical absorption band gap molecular-beam epitaxy (MBE) infrared detector Optical and Electronic Materials Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Solid State Physics and Spectroscopy |
| Content Type | Text |
| Resource Type | Article |
| Subject | Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering |
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