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| Content Provider | Springer Nature Link |
|---|---|
| Author | Chen, Xi Hu, Anmin Li, Ming Mao, Dali |
| Copyright Year | 2008 |
| Abstract | Oxidation of four typical lead frame copper alloys was investigated. The oxidation rate and adhesion strength of oxide films to copper alloy substrates were studied by measuring the thickness and carrying out peel tests. The results show that, although copper alloys C5191 and C7025 have thinner oxide films, a lower adhesion strength and a higher proportion of CuO were obtained than in the other copper alloys EFTEC64T and C194. The adhesion strength is mainly influenced by the structure of the oxide film of the copper alloys, especially the CuO/Cu$_{2}$O ratio in the film. The highest adhesion strength is obtained for the copper oxide film with a basic structure of CuO/Cu$_{2}$O/Cu and a CuO/Cu$_{2}$O ratio of about 0.1. The segregation of additional elements in the copper alloy plays an important role in the oxide film structure. |
| Starting Page | 372 |
| Ending Page | 378 |
| Page Count | 7 |
| File Format | |
| ISSN | 03615235 |
| Journal | Journal of Electronic Materials |
| Volume Number | 38 |
| Issue Number | 2 |
| e-ISSN | 1543186X |
| Language | English |
| Publisher | Springer US |
| Publisher Date | 2008-11-06 |
| Publisher Place | Boston |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Oxidation adhesion strength lead frame copper alloy diffusion Solid State Physics and Spectroscopy Electronics and Microelectronics, Instrumentation Characterization and Evaluation of Materials Optical and Electronic Materials |
| Content Type | Text |
| Resource Type | Article |
| Subject | Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering |
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