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| Content Provider | Springer Nature Link |
|---|---|
| Author | Sivasubramaniam, V. Bosco, N.S. Janczak Rusch, J. Cugni, J. Botsis, J. |
| Copyright Year | 2008 |
| Abstract | The effects of particle reinforcement of Sn-4.0wt.%Ag-0.5wt.%Cu (SAC405) lead-free solder on interfacial intermetallic layer growth and strength of the ensuing joints through short-term isothermal aging (150°C) were studied. Composite solders were prepared by either incorporating 2 wt.% Cu (3 μm to 20 μm) or Cu$_{2}$O (∼150 nm) particles into SAC405 paste. Aggressive flux had the effect of reducing the Cu$_{2}$O nanoparticles into metallic Cu which subsequently reacted with the solder alloy to form the Cu$_{6}$Sn$_{5}$ intermetallic. While all solders had similar interfacial intermetallic growth upon reflow, both of the composite solders’ growth rates slowed through aging to reach a common growth rate exponent of approximately 0.38, considerably lower than that of the nonreinforced solder (n = 0.58). The nanoscale reinforced solder additionally exhibited the highest tensile strength in both the initial and aged conditions, behavior also attributed to its quick conversion to a stable microstructure. |
| Starting Page | 1598 |
| Ending Page | 1604 |
| Page Count | 7 |
| File Format | |
| ISSN | 03615235 |
| Journal | Journal of Electronic Materials |
| Volume Number | 37 |
| Issue Number | 10 |
| e-ISSN | 1543186X |
| Language | English |
| Publisher | Springer US |
| Publisher Date | 2008-07-29 |
| Publisher Place | Boston |
| Access Restriction | One Nation One Subscription (ONOS) |
| Subject Keyword | Lead-free solder nanocomposite aging intermetallic compounds tension test Solid State Physics and Spectroscopy Electronics and Microelectronics, Instrumentation Characterization and Evaluation of Materials Optical and Electronic Materials |
| Content Type | Text |
| Resource Type | Article |
| Subject | Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering |
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